iKon-M SY

Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV.

Full overview >

5 Year Vacuum Warranty
‘Standalone’ Be Window
Multi-Megahertz readout
Crop mode operation
USB 2.0 connection

询价增加到询价列表在询价列表中查看此产品

Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV.

This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively.

UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year.

'Standalone’ Be Window - 200 µm Berylium window as standard

13 x 13 µm pixel size - Optimal balance of dynamic range and resolution

Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available

Multi-Megahertz pixel readout - High frame rates achievable (5 MHz in visualization mode, 50 kHz for the highest sensitivity and signal-to-noise ratio)

USB 2.0 connection - USB plug and play – no controller box

Enhanced baseline clamp - Quantitative accuracy of dynamic measurements.

Cropped sensor mode - Specialized acquisition mode for continuous imaging with fast temporal resolution

Integrated in EPICS - Platform is fully integrated into the EPICS control software

Spec sheet